| Feature |
|
 |
JEDEC Standard VDD/VDDQ = 1.5V ±
0.075V. |
|
 |
All inputs and outputs are
compatible with SSTL_15 interface. |
|
 |
Fully differential clock
inputs (CK,/CK) operation. |
|
 |
8 banks |
|
 |
Posted CAS by programmable additive
latency |
|
 |
Bust length: 4 with Burst Chop (BC) and
8. |
|
 |
CAS Write Latency (CWL): 5, 6, 7, 8 |
|
 |
CAS Latency (CL): 6, 7, 8, 9, 10, 11 |
|
 |
Write Latency (WL) =Read Latency (RL)
-1. |
|
 |
Bi-directional Differential
Data Strobe (DQS) |
|
 |
Data inputs on DQS centers
when write. |
|
 |
Data outputs on DQS, /DQS edges when read. |
|
 |
On chip DLL align DQ, DQS and
/DQS transition with CK transition. |
|
 |
DM mask write data-in at the
both rising and falling edges of the data strobe. |
|
 |
Sequential & Interleaved Burst type
available both for 8 & 4 with BC. |
|
 |
Multi Purpose Register (MPR) for
pre-defined pattern read out |
|
 |
On Die Termination (ODT) options:
Synchronous ODT, Dynamic ODT, and Asynchronous ODT |
| |
 |
Auto refresh and self refresh. |
| |
 |
8,192 Refresh Cycles / 64ms . |
| |
 |
Refresh Interval: 7.8us T case
between 0°C
~ 85°C |
| |
 |
Refresh Interval: 3.9us T case
between 85°C
~ 95°C |
| |
 |
RoHS Compliance |
| |
 |
Driver Strength: RZQ/7, RZQ/6,RZQ/5(RZQ=240 Ω) |
| |
 |
High Temperature Self-Refresh rate
enable |
| |
 |
Multi Purpose Register for pre-defined
pattern read out |
| |
 |
ZQ calibration for DQ drive and ODT |
| |
 |
RESET pin for initialization and reset
function |